test vectorの例文

• The functional verification data are usually called " test vectors ".
• In this context X _ i is called a test vector.
• These generate test vectors by examining the structure of the logic and systematically generating tests for particular faults.
• For this combination of ( \ theta, \ psi ) the test vector points to the south.
• This backdoor was then backdoored itself by an unknown party which changed the Q point and some test vectors.
• The functional test vectors may be preserved and used in the factory to test that newly constructed logic works correctly.
• After fusing, the outputs of the PAL could be verified if test vectors were entered in the source file.
• Another advantage is that it may catch faults that are not found by conventional stuck-at fault test vectors.
• While testing the system, various test vectors must be used to examine the system's behavior with differing inputs.
• Testing involves a number of test vectors, each of which drives some signals and then verifies that the responses are as expected.
• Details on the proposals submitted for each can be found at the NIST Block Cipher Modes Development site, including patent and test vector information.
• Large gains are possible since any particular test vector usually only needs to set and / or examine a small fraction of the scan chain bits.
• Their polar angles exceed the maximum value for the rectangle, so the test vector wanders outside of the area I want it to stay in.
• For this reason, little-endian systems return correct test vector results only through considerable byte-swapping, with efficiency reduced as a result ."
• It was submitted to NIST by Joachim Vance of VeriFone Systems Inc . Test vectors are not supplied separately from FF1 and parts of it are patented.
• When I moved the test vector "'X "'5 outside of the rectangle at least two of the dot products turned negative.
• The test vector is a collection of bits to apply to the circuit's inputs, and a collection of bits expected at the circuit's output.
• These tests are often done in an anechoic chamber with a controlled RF environment where the test vectors produce a RF field similar to that produced in an actual environment.
• The distance between each test vector and each prototype is calculated and the k test vectors closest to the prototype vectors are taken as the most likely classification or group of classifications.
• The distance between each test vector and each prototype is calculated and the k test vectors closest to the prototype vectors are taken as the most likely classification or group of classifications.